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Imaging » Knowledge Center » Research Papers

Research Papers

Research is a crucial component of our competitive engine. Teledyne DALSA devotes a significant amount of its budget to research, and is consistently one of Canada's top 50 corporate R&D spenders. This page lists some of our recent publications.

Imaging Papers

Using an n-zone TDI camera for acquisition of multiple images with different illuminations in a single scan
Colin Flood, Teledyne DALSA, and Ralf Zink, Robert Bosch GmbH, January 2013

MEM-FLIM, a CCD Imager for Fluorescence Lifetime Imaging Microscopy
Jan Bosiers, Harry van Kuijk, Wilco Klaassens, René Leenen, Willem Hoekstra, Walter de Laat, Agnes Kleimann, Inge Peters, Jan Nooijen, Qiaole Zhao1, Ian Ted Young1, Sander de Jong2, Kees Jalink3,
Teledyne DALSA Professional Imaging, The Netherlands,
1 Delft University of Technology, Delft, NL;
2 Lambert Instruments, Roden, NL;
3 Netherlands Cancer institute, Amsterdam, NL.
Presented at International Image Sensor Workshop 2013

Medical X-Ray Imaging Using Wafer-Scale CMOS Image Sensors
Jan Bosiers, Teledyne DALSA, Fraunhofer CMOS Workshop 2012

Challenges for very large CCD & CMOS Imagers
Jan Bosiers & Laurens Korthout, Teledyne DALSA, Image Sensors Europe 2011, London

Analysis of Blinking Pixels in CCD Imagers with and without Surface Pinning
Inge Peters, Erik Bogaart*, Erik-Jan Manoury, Adri Mierop, Jan Bosiers
International Image Sensor Workshop 2011

A 23 x 25.9cm2 RGB color CMOS Imager System for Digital Photography
Hein Loijens, Bart Dillen, Wasim Muhammad, Daniel Verbugt, Laurens Korthout, Peter te Vaarwerk, Auke van der Heide, Leon Ponjee, Kim Theuwissen, Piet Jansen, Frank Polderdijk, Jan Bosiers
International Image Sensor Workshop 2011

Prototype Line‐Scan Device with 12‐bit Charge Domain Column‐Parallel Successive Approximation ADC
Laurens Korthout, Daniel Verbugt, Paul Donegan, Adri Mierop
International Image Sensor Workshop 2011

Defective pixel map creation based on wavelet analysis in digital radiography detectors
Chun Joo Park a, Hyoung Koo Lee b, William Y. Song a, Thorsten Graeve Achterkirchen c, Ho Kyung Kim d,
a Department of Radiation Oncology, University of California San Diego, 3855 Health Sciences Drive, La Jolla, CA 92093-0843, USA
b Department of Mining and Nuclear Engineering, Missouri University of Science and Technology, 210 Fulton Hall, 310 West 14th St., Rolla, MO 65409-0170, USA
c Rad-icon Imaging, DALSA Corporation, Sunnyvale, CA 94085, USA
d School of Mechanical Engineering, Pusan National University, Jangjeon-dong, Geumjeong-gu, Busan 609-735, Republic of Korea
Nuclear Instruments and Methods in Physics Research A (NIMA), April 2011

Very-Low Dark Current in  Full-Frame CCDs
Erik Bogaart, Inge Peters, Willem Hoekstra,  Agnes Kleimann and Jan Bosiers
Image Sensors Europe 2010, London

Wafer-scale CMOS imagers for medical X-ray applications
L. Korthout, D.Verbugt, A.Mierop, W.de Haan, W.Maes, J. de Meulmeester, W. Muhammad, B. Dillen, H. Stoldt, I. Peters, E. Fox and  J. Bosiers.
Image Sensors Europe 2010, London

Edge-enhanced imaging obtained with very broad energy band x-rays
A. Taibi,1 P. Cardarelli,1 G. Di Domenico,1 M. Marziani,1 M. Gambaccini,1 T. Hanashima,2 and H. Yamada3 1 Department of Physics, University of Ferrara, INFN Section of Ferrara, via Saragat 1, 44100 Ferrara, Italy
2 Photon Production Laboratory Ltd., 1-1-1 Nojihigashi, Kusatsu, Shiga 525-8577, Japan
3 Synchrotron Light Life Science Center, Ritsumeikan University, 1-1-1 Nojihigashi, Kusatsu, Shiga 525-8577, Japan
APPLIED PHYSICS LETTERS 96, 144102 (2010)

High-Speed Imaging with CCDs
Jan Bosiers, International Solid State Circuits Conference 2010, Imaging Forum

Very Low Dark Current CCD Image Sensor
Erik Bogaart, Willem Hoekstra, Inge Peters, Agnes Kleimann, Jan Bosiers
IEEE Transactions on Electron Devices,  Nov. 2009

Very Large Area CMOS Active-Pixel Sensor for Digital Radiography
Michael Farrier, Member, IEEE, Thorsten Graeve Achterkirchen, Senior Member, IEEE, Gene P. Weckler, Life Member, IEEE, and Alex Mrozack
IEEE Transactions on Electron Devices, Special Edition on Image Sensors, November 2009.

Flexible binning structure for CCD color imagers
Jan Bosiers, Harry van Kuijk, Agnes Kleimann, Inge Peters, Frank Polderdijk
Presented at International Image sensor Workshop, Bergen (Norway), June 2009

Very-low Dark Current in FF-CCDs
I. M. Peters, E. W. Bogaart, W. Hoekstra, A. C. M. Kleimann and J. T. Bosiers
Presented at International Image sensor Workshop, Bergen (Norway), June 2009

A wafer-scale CMOS APS imager for medical X-ray applications
L. Korthout, D.Verbugt, J.Timpert, A.Mierop, W.de Haan, W.Maes, J. de Meulmeester, W. Muhammad, B. Dillen, H. Stoldt, I. Peters, E. Fox
Presented at International Image sensor Workshop, Bergen (Norway), June 2009

IDEAL: An image pre-processing architecture for high-end professional DSC applications
Auke van der Heide, Takashi Urano, Frank Polderdijk, Wim de Haan, Jan T. Bosiers
Presented at SPIE conference on Electronic Imaging, San Jose, January 2009

Very-large-area CCD image sensors: concept and cost-effective research
E.W. Bogaart, I.M. Petersa, A.C.M. Kleimann, E.J.P. Manoury, W. Klaassens, W.T.F.M. de Laat, C. Draijer, R. Frost, and J.T. Bosiers
Presented at SPIE conference on Electronic Imaging, San Jose, January 2009

A 36 x 48 mm 48M-pixel CCD imager for professional DSC applications
Erik-Jan P. Manoury, Wilco Klaassens, Harry C. van Kuijk, Louis H. Meessen, Agnes C. Kleimann, Erik W. Bogaart, Inge M. Peters, Holger Stoldt, Mesut Koyuncu, Jan T. Bosiers
Presented at IEDM in December 2008

A 28M 43cm2 full-frame CCD Imager for Medical and Scientific Applications (“Big is Beautiful”)
J. Bosiers, B. Dillen and L. Meessen
Presented at the International Image Sensors Workshop in May 2007

2.5 µm Pixel Linear CCD
Nixon O, Lei Wu, Melanie Ledgerwood, John Nam, Jonathan Huras
Presented at the International Image Sensors Workshop in May 2007

Analysis of Near-Field Diffraction Effects on CCD Resolution
D. Logan, S. McFaul, P.E. Jessop, A.P. Knights, M. Ledgerwood, N. O
Presented at the 13th Canadian Semiconductor Technology Conference in 2007

Random Telegraph Signal in CMOS Image Sensor Pixel.
Xinyang Wang, Padmakumar R. Rao, Adri Mierop*, Albert J.P. Theuwissen
Presented at IEDM 2006

“Technical challenges and recent progress in CCD imagers”
J. Bosiers, I. Peters, C. Draijer and A. Theuwissen
Nuclear Inst. and Methods in Physics Research, A, 2006 – Elsevier.

“28-M CCD imager with RGB compatible binning feature for professional applications”
I. Peters, C. Draijer, F. Polderdijk, L. Meessen, B. Dillen,  W. Klaassens, and J. Bosiers
Proceedings of SPIE, Volume 6068, Sensors, Cameras, and Systems for Scientific/Industrial Applications VII, 2006

“Imagers for Professional Digital Photography”
J. Bosiers, B. Dillen, C. Draijer and I. Peters
ICIS '06, Rochester, New York; May 7, 2006

 “Featuring in CCD Imagers”
J. Bosiers, I. Peters andC. Draijer
2006 Proceedings of SPIE,  Volume 6196, Photonics in Multimedia, April  2006

“Imagers for digital still photography” (Invited paper)
J. Bosiers, B. Dillen, C. Draijer, E.-J. Manoury, L. Meessen and I. Peters
2006 Proceedings of SPIE,  Volume 6196, Photonics in Multimedia, April 2006

“Challenges and innovations in very-large CCD and CMOS imagers for professional imaging ” (invited paper)
J. Bosiers, H. Stoldt, W. Klaassensa, B. Dillena, I. Peters, E. Bogaart, R. Frost, L. Korthout, J. Timpert
2007 Proceedings of SPIE,  Volume 7001, Photonics in Multimedia, April  2006

“A 28 mega pixel large area full frame CCD with 2 x 2 on-chip RGB charge-binning for professional digital still imaging”
C.Draijer, F. Polderdijk, A. van der Heide, B.   Dillen, W. Klaassens and J. Bosiers
IEDM Technical Digest, Washington, D.C., Dec. 2005

“The hole role”
A. Theuwissen, J.   Bosiers, E. Roks
IEEE Electron Devices Meeting, 2005. IEDM Technical Digest, Washington, D.C., Dec. 2005

Design of a 148,680-pixel Ultrahigh-speed, High-sensitivity CCD
H.Ohtake, T.Hayashida, K.Kitamura, T.Arai, J.Yonai, H.Maruyama, K.Tanioka, T.G. Etoh, D. Poggemann, A. Ruckelshausen, H. van Kuijk and Jan T. Bosiers
CCD & AIS Workshop 2005, Karuizawa, Japan

Stitched mk x 96 7µm Pixel TDI Sensor
L. Wu, N. O, C. Draijer, J. Bosiers, H. van Kuijk and H. Stoldt
2005 CCD & AIS Workshop, Karuizawa, Japan

“A High-speed, High-sensitivity ½ Inch 1M-pixel Frame-Transfer CCD Imager for Medical and Industrial Applications”
A. Stravers-Cimpoiasua, Holger Stoldt, W. Klaassens, R. Frost and J. Bosiers
Proceedings of SPIE, Vol. 5677, Sensors and Camera Systems for Scientific and Industrial Applications VI,  March 2005

Dark Current Reduction in FF-CCDs
I.  Peters, A. Kleimann, W. Klaassens, F. Polderdijk and J. Bosiers
2005 CCD & AIS Workshop, Karuizawa, Japan

Third Generation Large Area Professional DSC CCD Process and Design Technology
C. Draijer, W. Klaassens, H.L. Peek, H. Stoldt, B.Dillen and J. Bosiers
2005 CCD & AIS Workshop, Karuizawa, Japan

A 4M Pixel CMOS Image Sensor for High Speed Image Capture
P. Donegan, E. Fox, B. Li, M. Sonder, F. Feng, M. Kiik, S. Xie
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2005

12k 5 μm linescan CCD sensor with 320 MHz data rate
Brian Benwell, Nixon O, Gary Allan, Jonathan Huras, Melanie Ledgerwood
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2005

High Dynamic Range Data Centric Workflow System
Lucian Ion, Alan Lasky, John Coghill
Presented at the SMPTE Technical Conference and Exhibit, New York, November 2005

High Dynamic Range Workflow Considerations (slides).
John Coghill
Presented at the SMPTE Technical Conference and Exhibit, New York, November 2005

White Paper: Image Sensor Architectures for Digital Cinematography. 2005.

“Dark current reduction in very-large area CCD imagers for professional DSC applications”
I. Peters, A.  Kleimann, F. Polderdijk, W. Klaassens, R. Frost and J. Bosiers
IEDM Technical Digest, San Francsico, Dec. 2004

"Degradation Behavior and Mechanisms of CCD Image Sensor with Deep-UV Laser Radiation"
Flora M. Li, Nixon O, Arokia Nathan
IEEE Transactions on Electron Devices, Vol. 51, No. 12, December 2004

White Paper: 4K Digital Capture and Postproduction Workflow.
Lucian Ion and Neil Humphrey, 2004

 “A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging”
J. Bosiers, B. Dillen, C. Draijer, A. Kleimann, F. Polderdijk, M de Wolf, W. Klaassens, A. Theuwissen, H. Peek and H.O. Folkerts
IEEE Transactions on Electron Devices,  vol. 50,  no. 1, Jan 2003

Design Considerations For large Area Professional DSC CCD Imager Output Amplifiers
C .Draijer, W. Klaassens, H. Peek, B. Dillen and J.Bosiers
2003 CCD & AIS Workshop, Elmau, Germany

Image Resolution of the One-CCD Palomar Motion Picture Camera
Charles Smith, Felicia Shu, Lucian Ion, Matthew Cowan
Presented at the 37th Advanced Motion Imaging Conference, 2003

CCD Detection of 157 nm Photons
Flora Li, Nixon O, and Arokia Nathan
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2003

248-nm UV Damage Mechanism in MPP CCDs
Nixon O, Jonathan Huras, Sukhbir Kullar, Saladin Sahinovic
Presented at the IEEE Workshop on Charge Coupled Devices and Advanced Image Sensors in 2003

"UV-Responsive CCD Image Sensors with Enhanced Inorganic Phospor Coatings"
Wendy A.R. Franks, Martin J. Kiik,and Arokia Nathan
This paper first appeared in IEEE Transactions on Electron Devices, Vol. 50, No. 2, Februrary 2003

Semiconductor Papers

Comprehensive study of properties and characteristics of in-situ phosphorous doped poly-silicon developed in LPCVD furnace. M. Choudhury, V. Fortin, R. Antaki, A. Dallaire et L. Ouellet. Article presented at Functional Coatings and Surface Engineering (FCSE) Symposium, Montréal, Québec, June 2008.

High-Voltage Operational Amplifier Based on Dual Floating-Gate Transistors. Zhengrong Huang, Yvon Savaria, Mohamad Sawan – Ecole Polytechnique de Montréal, Rémi Meingan – DALSA Semiconducteur. Presented at International Symposium on Circuits and Systems (ISCAS 2006), May 2006, Island of Kos, Greece.

System Integration of High Voltage Electronic MEMS Actuators. Jean-François Saheb, Jean-François Richard, Rémi Meingan – DALSA Semiconducteur , Mohamad Sawan, Yvon Savaria – Ecole Polytechnique de Montréal. Presented at Northeast Workshop on Circuits and Systems (NEWCAS 2005), June 2005, Québec, Québec, Canada.

A Wide Tuning Range Voltage-Controlled Ring Oscillator dedicated to Ultrasound Transmitter. Robert Chebli, X. Zhao, Mohamad Sawan – Ecole Polytechnique de Montréal. Presented at International Conference on Microelectronics (ICM 2004), Décembre 2004, Tunis, Tunisia.

A Dynamically Controlled and Refreshed Low-Power Level-up Shifter. Zhengrong Huang, Yvon Savaria, Mohamad Sawan – Ecole Polytechnique de Montréal. Presented at MidWest Symposium on Circuits And Systems (MWSCAS 2004), Juillet 2004, Hiroshima, Japan.

A CMOS High-Voltage DC/DC Up Converter Dedicated for Ultrasonic Applications. Robert Chebli, Mohamad Sawan – Ecole Polytechnique de Montréal. Presented at International Workshop – System On Chip (IWSOC 2004), Juillet 2004, Banff, Alberta, Canada

Robust Design of a Dynamically Controlled Low-Power Level-up Shifter Operating up to 300V. Zhengrong Huang, Yvon Savaria, Mohamad Sawan - Ecole Polytechnique de Montréal. Presented at Northeast Workshop on Circuits and Systems (NEWCAS 2004), Juin 2004, Montréal, Québec, Canada.

High Voltage Charge Pump using Standard CMOS Technology. Jean-François Richard – DALSA Semiconducteur, Yvon Savaria - Ecole Polytechnique de Montréal. Presented at Northeast Workshop on Circuits and Systems (NEWCAS 2004), Juin 2004, Montréal, Québec, Canada.

High Voltage Interfaces for CMOS/DMOS Technologies. Jean-François Richard, Bruno Lessard, Rémi Meingan, Stéphane Martel – DALSA Semiconducteur, Yvon Savaria - Ecole Polytechnique de Montréal. Presented at Northeast Workshop on Circuits and Systems (NEWCAS 2003), Juin 2003, Montréal, Québec, Canada.

High Voltage Interfaces for CMOS/DMOS Technologies. Jean-Francois Richard, Bruno Lessard, Rmi Meingan, Stphane Martel and Yvon Savaria. Presented at IEEE Northeast Workshop on Circuits and Systems 2003.

Low-temperature MEMS processing for intelligent MEMS over CMOS. Luc Ouellet. Presented at the Symposium On Microelectronics Research & Development in Canada (MR&DCAN 2003) in Montreal, Quebec, 2003.

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